By Peter W. Hawkes
Advances in Imaging and Electron Physics merges long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This sequence gains prolonged articles at the physics of electron units (especially semiconductor devices), particle optics at low and high energies, microlithography, photo technology and electronic photograph processing, electromagnetic wave propagation, electron microscopy, and the computing equipment utilized in these types of domains.
- Contributions from prime overseas students and experts
- Discusses sizzling subject parts and provides present and destiny study trends
- Invaluable reference and advisor for physicists, engineers and mathematicians
Read or Download Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers: 162 PDF
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Extra info for Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers: 162
Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers: 162 by Peter W. Hawkes